Standard

Degradation of bisphenol-a-polycarbonate (BPA-PC) optical lenses under simulated harsh environment conditions. / Mehr, Maryam Yazdan; Van Driel, Willem; Zhang, Kouchi.

2019 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2019. Institute of Electrical and Electronics Engineers Inc., 2019. p. 1-4 8724524.

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Harvard

Mehr, MY, Van Driel, W & Zhang, K 2019, Degradation of bisphenol-a-polycarbonate (BPA-PC) optical lenses under simulated harsh environment conditions. in 2019 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2019., 8724524, Institute of Electrical and Electronics Engineers Inc., pp. 1-4, 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2019, Hannover, Germany, 24/03/19. https://doi.org/10.1109/EuroSimE.2019.8724524

APA

Mehr, M. Y., Van Driel, W., & Zhang, K. (2019). Degradation of bisphenol-a-polycarbonate (BPA-PC) optical lenses under simulated harsh environment conditions. In 2019 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2019 (pp. 1-4). [8724524] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EuroSimE.2019.8724524

Vancouver

Mehr MY, Van Driel W, Zhang K. Degradation of bisphenol-a-polycarbonate (BPA-PC) optical lenses under simulated harsh environment conditions. In 2019 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2019. Institute of Electrical and Electronics Engineers Inc. 2019. p. 1-4. 8724524 https://doi.org/10.1109/EuroSimE.2019.8724524

Author

Mehr, Maryam Yazdan ; Van Driel, Willem ; Zhang, Kouchi. / Degradation of bisphenol-a-polycarbonate (BPA-PC) optical lenses under simulated harsh environment conditions. 2019 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2019. Institute of Electrical and Electronics Engineers Inc., 2019. pp. 1-4

BibTeX

@inproceedings{c1d044e5e7cd4999a2ed88b0b11e13c1,
title = "Degradation of bisphenol-a-polycarbonate (BPA-PC) optical lenses under simulated harsh environment conditions",
abstract = "This paper investigates degradation and failure mechanisms of BPA-PC lenses in simulated harsh environment conditions. Exposure of secondary optics in Light Emitting Diode LED-based systems or any other similar applications to environmental stresses can adversely effect the performance and lifetime of products. This paper simulates a harsh environment condition, using a salt bath oven. Salt spray exposure/ageing tests at 45° C were carried out up to four months. Fourier transform infrared-attenuated total reflection FTIR-ATR spectrometer and Lambda 950 Ultraviolet-Visible (UV-VIS) spectrophotometer were used to study the optical and chemical characteristics of aged plates. Results showed that salt bath exposure test resulted in the severe deterioration of optical characteristics BPA-PC samples. Degradation of optical properties of BPA-PC plates is attributable to the oxidation of samples.",
author = "Mehr, {Maryam Yazdan} and {Van Driel}, Willem and Kouchi Zhang",
year = "2019",
month = "3",
day = "1",
doi = "10.1109/EuroSimE.2019.8724524",
language = "English",
isbn = "978-1-5386-8041-4",
pages = "1--4",
booktitle = "2019 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2019",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",

}

RIS

TY - GEN

T1 - Degradation of bisphenol-a-polycarbonate (BPA-PC) optical lenses under simulated harsh environment conditions

AU - Mehr, Maryam Yazdan

AU - Van Driel, Willem

AU - Zhang, Kouchi

PY - 2019/3/1

Y1 - 2019/3/1

N2 - This paper investigates degradation and failure mechanisms of BPA-PC lenses in simulated harsh environment conditions. Exposure of secondary optics in Light Emitting Diode LED-based systems or any other similar applications to environmental stresses can adversely effect the performance and lifetime of products. This paper simulates a harsh environment condition, using a salt bath oven. Salt spray exposure/ageing tests at 45° C were carried out up to four months. Fourier transform infrared-attenuated total reflection FTIR-ATR spectrometer and Lambda 950 Ultraviolet-Visible (UV-VIS) spectrophotometer were used to study the optical and chemical characteristics of aged plates. Results showed that salt bath exposure test resulted in the severe deterioration of optical characteristics BPA-PC samples. Degradation of optical properties of BPA-PC plates is attributable to the oxidation of samples.

AB - This paper investigates degradation and failure mechanisms of BPA-PC lenses in simulated harsh environment conditions. Exposure of secondary optics in Light Emitting Diode LED-based systems or any other similar applications to environmental stresses can adversely effect the performance and lifetime of products. This paper simulates a harsh environment condition, using a salt bath oven. Salt spray exposure/ageing tests at 45° C were carried out up to four months. Fourier transform infrared-attenuated total reflection FTIR-ATR spectrometer and Lambda 950 Ultraviolet-Visible (UV-VIS) spectrophotometer were used to study the optical and chemical characteristics of aged plates. Results showed that salt bath exposure test resulted in the severe deterioration of optical characteristics BPA-PC samples. Degradation of optical properties of BPA-PC plates is attributable to the oxidation of samples.

UR - http://www.scopus.com/inward/record.url?scp=85067525947&partnerID=8YFLogxK

U2 - 10.1109/EuroSimE.2019.8724524

DO - 10.1109/EuroSimE.2019.8724524

M3 - Conference contribution

SN - 978-1-5386-8041-4

SP - 1

EP - 4

BT - 2019 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2019

PB - Institute of Electrical and Electronics Engineers Inc.

ER -

ID: 55510493