Detecting intra-word faults in word-oriented memories

S Hamdioui, AJ van de Goor, M Rodgers

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

2 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	21th IEEE VLSI test symposium
Editors	s.n.
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	241-247
Number of pages	7
ISBN (Print)	0-7695-1924-5
Publication status	Published - 2003
Event	21th IEEE VLSI test symposium, Napa Valley, California - Piscataway Duration: 27 Apr 2003 → 1 May 2003

Name
Publisher	IEEE

Conference	21th IEEE VLSI test symposium, Napa Valley, California
Period	27/04/03 → 1/05/03

Keywords

@inproceedings{7ddddc1e664a460e8908e9be51bb475f,

title = "Detecting intra-word faults in word-oriented memories",

keywords = "Conf.proc. > 3 pag",

author = "S Hamdioui and {van de Goor}, AJ and M Rodgers",

year = "2003",

language = "Undefined/Unknown",

isbn = "0-7695-1924-5",

publisher = "IEEE Society",

pages = "241--247",

editor = "s.n.",

booktitle = "21th IEEE VLSI test symposium",

note = "21th IEEE VLSI test symposium, Napa Valley, California ; Conference date: 27-04-2003 Through 01-05-2003",

}

TY - GEN

T1 - Detecting intra-word faults in word-oriented memories

AU - Hamdioui, S

AU - van de Goor, AJ

AU - Rodgers, M

PY - 2003

Y1 - 2003

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7695-1924-5

SP - 241

EP - 247

BT - 21th IEEE VLSI test symposium

A2 - s.n., null

PB - IEEE Society

CY - Piscataway

T2 - 21th IEEE VLSI test symposium, Napa Valley, California

Y2 - 27 April 2003 through 1 May 2003

ER -