Abstract
The invention relates to a vapor transmission rate measurement device (102), comprising a pressure sensor (110) and a chamber (106) with a chamber volume V, the chamber (106) having an opening (114) with a surface area A, the opening (114) being arranged to be spanned by a film (112) of permeable sample material. The vapor transmission rate measurement device (102) is arranged for determining an indication of the vapor transmission rate for the film (112) permeated by a vapor (116), based on at least one measurement by the pressure sensor (110) of a pressure P within the chamber (106). A ratio R between the chamber volume V and the surface area A is smaller that 10 -5 m.
The pressure sensor (110) may for example have a microelectromechanical or nanoelectromechanical resonator (202), or a microelectronic or nanoelectronic Pirani gauge (302).
Original language | English |
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Patent number | NL2004419 |
Priority date | 17/03/10 |
Publication status | Published - 2010 |
Keywords
- other public output
- Octrooi
- Geen VSNU-classificatie