• ETS19

    Accepted author manuscript, 1 MB, PDF-document

Hard-to-detect faults such as weak and random faults in FinFET SRAMs represent an important challenge for manufacturing testing in scaled technologies, as they may lead to test escapes. This paper proposes a Design-for-Testability (DFT) scheme able to detect such faults by monitoring the bitline swing of FinFET memories. Using only five operations per cell, we are able to detect defects that cause deterministic, random, and weak faults. Compared to the state of the art, this leads to an improved detection capability at reduced area overhead.
Original languageEnglish
Number of pages2
Publication statusAccepted/In press - 2019
Event24th IEEE European Test Symposium 2019 - Baden-Baden, Germany
Duration: 27 May 201931 May 2019
Conference number: 24th


Conference24th IEEE European Test Symposium 2019
Abbreviated titleETS
Internet address

    Research areas

  • Hard-to-Detect Faults, DFT, SRAM, FinFET

ID: 55614225