DfT schemes for resistive open defects in RRAMs

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

49 Citations (Scopus)

Original language	English
Title of host publication	Design, automation & test in Europe conference & exhibition
Editors	s.n.
Place of Publication	s.l.
Publisher	s.n.
Pages	1-6
Number of pages	6
Publication status	Published - 2012
Event	DATE 2012 - s.l. Duration: 12 Mar 2012 → 16 Mar 2012

Name
Publisher	s.n.

Conference	DATE 2012
Period	12/03/12 → 16/03/12

Cite this

@inproceedings{86f5459abd034e61b0462be0367199bc,

title = "DfT schemes for resistive open defects in RRAMs",

author = "NZB Haron and S Hamdioui",

year = "2012",

language = "English",

publisher = "s.n.",

pages = "1--6",

editor = "s.n.",

booktitle = "Design, automation & test in Europe conference & exhibition",

note = "DATE 2012 ; Conference date: 12-03-2012 Through 16-03-2012",

}

TY - GEN

T1 - DfT schemes for resistive open defects in RRAMs

AU - Haron, NZB

AU - Hamdioui, S

PY - 2012

Y1 - 2012

UR - http://ce-publications.et.tudelft.nl/publications/131_dft_schemes_for_resistive_open_defects_in_rrams.pdf

M3 - Conference contribution

SP - 1

EP - 6

BT - Design, automation & test in Europe conference & exhibition

A2 - s.n., null

PB - s.n.

CY - s.l.

T2 - DATE 2012

Y2 - 12 March 2012 through 16 March 2012

ER -