Dielectric diffusion depth profiling: a method for assessing environmental degradation in epoxy coatings

M Giacomelli Penon, SJ Picken, J van Turnhout

    Research output: Contribution to conferencePosterProfessional

    Original languageUndefined/Unknown
    Publication statusPublished - 2004
    Event3rd International Conference on Broadband Dielectric Spectroscopy and its Applications - Delft
    Duration: 23 Aug 200426 Aug 2004

    Conference

    Conference3rd International Conference on Broadband Dielectric Spectroscopy and its Applications
    Period23/08/0426/08/04

    Keywords

    • Geen BTA classificatie

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