Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface

EJ Marinissen; B De Wachter; K Smith; J Kiesewetter; M Taouil; S Hamdioui

doi:10.1109/TEST.2014.7035314

Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface

EJ Marinissen, B De Wachter, K Smith, J Kiesewetter, M Taouil, S Hamdioui

Computer Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

9 Citations (Scopus)

Original language	English
Title of host publication	Proceedings 2014 IEEE International Test Conference
Editors	M Purtell, S Mitra
Place of Publication	Washington, DC, USA
Publisher	ITC & IEEE
Pages	1-10
Number of pages	10
ISBN (Print)	978-1-4799-4722-5
DOIs	https://doi.org/10.1109/TEST.2014.7035314
Publication status	Published - 2014
Event	ITC 2014, Seattle, WA, USA - Washington, DC, USA Duration: 21 Oct 2014 → 23 Oct 2014

Publication series

Name
Publisher	ITC & IEEE

Conference

Conference	ITC 2014, Seattle, WA, USA
Period	21/10/14 → 23/10/14

Access to Document

10.1109/TEST.2014.7035314

Cite this

@inproceedings{69706c5b86794a999a6cd918b6896d2b,

title = "Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface",

author = "EJ Marinissen and {De Wachter}, B and K Smith and J Kiesewetter and M Taouil and S Hamdioui",

year = "2014",

doi = "10.1109/TEST.2014.7035314",

language = "English",

isbn = "978-1-4799-4722-5",

publisher = "ITC & IEEE",

pages = "1--10",

editor = "M Purtell and S Mitra",

booktitle = "Proceedings 2014 IEEE International Test Conference",

note = "ITC 2014, Seattle, WA, USA ; Conference date: 21-10-2014 Through 23-10-2014",

}

Marinissen, EJ, De Wachter, B, Smith, K, Kiesewetter, J, Taouil, M & Hamdioui, S 2014, Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface. in M Purtell & S Mitra (eds), Proceedings 2014 IEEE International Test Conference. ITC & IEEE, Washington, DC, USA, pp. 1-10, ITC 2014, Seattle, WA, USA, 21/10/14. https://doi.org/10.1109/TEST.2014.7035314

Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface. / Marinissen, EJ; De Wachter, B; Smith, K et al.
Proceedings 2014 IEEE International Test Conference. ed. / M Purtell; S Mitra. Washington, DC, USA: ITC & IEEE, 2014. p. 1-10.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface

AU - Marinissen, EJ

AU - De Wachter, B

AU - Smith, K

AU - Kiesewetter, J

AU - Taouil, M

AU - Hamdioui, S

PY - 2014

Y1 - 2014

U2 - 10.1109/TEST.2014.7035314

DO - 10.1109/TEST.2014.7035314

M3 - Conference contribution

SN - 978-1-4799-4722-5

SP - 1

EP - 10

BT - Proceedings 2014 IEEE International Test Conference

A2 - Purtell, M

A2 - Mitra, S

PB - ITC & IEEE

CY - Washington, DC, USA

T2 - ITC 2014, Seattle, WA, USA

Y2 - 21 October 2014 through 23 October 2014

ER -