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Effects of single vacancy defect position on the stability of carbon nanotubes. / Poelma, RH; Sadeghian Marnani, H; Koh, SW; Zhang, GQ.

In: Microelectronics Reliability, Vol. 52, No. 7, 2012, p. 1279-1284.

Research output: Contribution to journalArticleScientificpeer-review

Harvard

Poelma, RH, Sadeghian Marnani, H, Koh, SW & Zhang, GQ 2012, 'Effects of single vacancy defect position on the stability of carbon nanotubes', Microelectronics Reliability, vol. 52, no. 7, pp. 1279-1284. https://doi.org/10.1016/j.microrel.2012.03.015

APA

Vancouver

Author

Poelma, RH ; Sadeghian Marnani, H ; Koh, SW ; Zhang, GQ. / Effects of single vacancy defect position on the stability of carbon nanotubes. In: Microelectronics Reliability. 2012 ; Vol. 52, No. 7. pp. 1279-1284.

BibTeX

@article{41a60e2aa005465c8ea1ac98aeb70bd7,
title = "Effects of single vacancy defect position on the stability of carbon nanotubes",
author = "RH Poelma and {Sadeghian Marnani}, H and SW Koh and GQ Zhang",
note = "harvest Betreft: 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE 2011), Linz, Austria",
year = "2012",
doi = "10.1016/j.microrel.2012.03.015",
language = "English",
volume = "52",
pages = "1279--1284",
journal = "Microelectronics Reliability",
issn = "0026-2714",
publisher = "Elsevier",
number = "7",

}

RIS

TY - JOUR

T1 - Effects of single vacancy defect position on the stability of carbon nanotubes

AU - Poelma, RH

AU - Sadeghian Marnani, H

AU - Koh, SW

AU - Zhang, GQ

N1 - harvest Betreft: 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE 2011), Linz, Austria

PY - 2012

Y1 - 2012

U2 - 10.1016/j.microrel.2012.03.015

DO - 10.1016/j.microrel.2012.03.015

M3 - Article

VL - 52

SP - 1279

EP - 1284

JO - Microelectronics Reliability

JF - Microelectronics Reliability

SN - 0026-2714

IS - 7

ER -

ID: 3715516