TY - GEN
T1 - Efficient Methodology for ISO26262 Functional Safety Verification
AU - Silva, Felipe Augusto Da
AU - Bagbaba, Ahmet Cagri
AU - Hamdioui, Said
AU - Sauer, Christian
N1 - Accepted author manuscript
PY - 2019/7/1
Y1 - 2019/7/1
N2 - Tolerance to random hardware failures, required by ISO26262, entails accurate design behavior analysis, complex Verification Environments and expensive Fault Injection campaigns. This paper proposes a methodology combining the strengths of Automatic Test Pattern Generators (ATPG), Formal Methods and Fault Injection Simulation to decrease the efforts of Functional Safety Verification. Our methodology results in a fast-deployed Fault Injection environment achieving Fault detection rates higher than 99% on the tested designs. In addition, ISO26262 Tool Confidence level is improved by a fault analysis report that allows verification of malfunctions in the outputs of the tools.
AB - Tolerance to random hardware failures, required by ISO26262, entails accurate design behavior analysis, complex Verification Environments and expensive Fault Injection campaigns. This paper proposes a methodology combining the strengths of Automatic Test Pattern Generators (ATPG), Formal Methods and Fault Injection Simulation to decrease the efforts of Functional Safety Verification. Our methodology results in a fast-deployed Fault Injection environment achieving Fault detection rates higher than 99% on the tested designs. In addition, ISO26262 Tool Confidence level is improved by a fault analysis report that allows verification of malfunctions in the outputs of the tools.
KW - ATPG
KW - Fault Injection Simulation
KW - Formal Methods
KW - Functional Safety
KW - ISO26262
UR - http://www.scopus.com/inward/record.url?scp=85073751707&partnerID=8YFLogxK
U2 - 10.1109/IOLTS.2019.8854449
DO - 10.1109/IOLTS.2019.8854449
M3 - Conference contribution
SN - 978-1-7281-2491-9
T3 - 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
SP - 255
EP - 256
BT - 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
A2 - Gizopoulos, Dimitris
A2 - Alexandrescu, Dan
A2 - Papavramidou, Panagiota
A2 - Maniatakos, Michail
PB - IEEE
CY - Piscataway
T2 - 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
Y2 - 1 July 2019 through 3 July 2019
ER -