• AH Verbruggen
  • MJC van de Homberg
  • LC Jacobs
  • AJ Kalkman
  • JR Kraayeveld
  • S Radelaar
Original languageUndefined/Unknown
Title of host publicationMRS Symp. Proc. Materials Reliability in Microelectronics VII
EditorsJ Clement, R Keller, K Krisch, J Sanchez, Z Suo
Pages255-266
Number of pages12
Publication statusPublished - 1997

ID: 2419393