Electron Microscopy in the Netherlands

P Kruit, FW Schapink, JW Geus, AJ Verkleij, CE Hulstaert

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageUndefined/Unknown
    Pages (from-to)287-299
    Number of pages13
    JournalAdvances in Imaging and Electron Physics
    Volume96
    Publication statusPublished - 1996

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