Original language | Undefined/Unknown |
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Pages (from-to) | 287-299 |
Number of pages | 13 |
Journal | Advances in Imaging and Electron Physics |
Volume | 96 |
Publication status | Published - 1996 |
Electron Microscopy in the Netherlands
P Kruit, FW Schapink, JW Geus, AJ Verkleij, CE Hulstaert
Research output: Contribution to journal › Article › Scientific › peer-review