Evaluation of SRAM faulty behavior under bit line coupling

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

6 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	3rd International Design and Test workshop
Editors	s.n.
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	231-236
Number of pages	6
ISBN (Print)	978-1-4244-3477-0
Publication status	Published - 2008
Event	IDT2008 - Piscataway Duration: 20 Dec 2008 → 22 Dec 2008

Name
Publisher	IEEE

Conference	IDT2008
Period	20/12/08 → 22/12/08

neo

Keywords

@inproceedings{9ea6f7e2eb07462789883008706aa01f,

title = "Evaluation of SRAM faulty behavior under bit line coupling",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "Z Al-Ars and S Hamdioui",

note = "neo; IDT2008 ; Conference date: 20-12-2008 Through 22-12-2008",

year = "2008",

language = "Undefined/Unknown",

isbn = "978-1-4244-3477-0",

publisher = "IEEE Society",

pages = "231--236",

editor = "s.n.",

booktitle = "3rd International Design and Test workshop",

}

TY - GEN

T1 - Evaluation of SRAM faulty behavior under bit line coupling

AU - Al-Ars, Z

AU - Hamdioui, S

N1 - neo

PY - 2008

Y1 - 2008

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-1-4244-3477-0

SP - 231

EP - 236

BT - 3rd International Design and Test workshop

A2 - s.n., null

PB - IEEE Society

CY - Piscataway

T2 - IDT2008

Y2 - 20 December 2008 through 22 December 2008

ER -