Exploiting Network-on-Chip Structural Redundancy for a Cooperative and Scalable Built-In Self-Test Architecture

A Strano; C Gomez; D Ludovici; M Favalli; ME Gomez; D Bertozzi

Exploiting Network-on-Chip Structural Redundancy for a Cooperative and Scalable Built-In Self-Test Architecture

A Strano, C Gomez, D Ludovici, M Favalli, ME Gomez, D Bertozzi

Computer Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

20 Citations (Scopus)

Original language	English
Title of host publication	Proceedings Design, Automation and Test in Europe Conference and Exhibition (DATE 2011)
Editors	BM Al-Hashimi, W Rosenstiel
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	661-666
Number of pages	6
ISBN (Print)	978-3-9810801-7-9
Publication status	Published - 2011
Event	DATE'11 - Leuven, Belgium Duration: 14 Mar 2011 → 18 Mar 2011

Publication series

Name
Publisher	IEEE

Conference

Conference	DATE'11
Period	14/03/11 → 18/03/11

Keywords

Elektrotechniek
Techniek
Conf.proc. > 3 pag

Cite this

@inproceedings{0c81df8e681344628eb13997fe8df1a1,

title = "Exploiting Network-on-Chip Structural Redundancy for a Cooperative and Scalable Built-In Self-Test Architecture",

keywords = "Elektrotechniek, Techniek, Conf.proc. > 3 pag",

author = "A Strano and C Gomez and D Ludovici and M Favalli and ME Gomez and D Bertozzi",

year = "2011",

language = "English",

isbn = "978-3-9810801-7-9",

publisher = "IEEE Society",

pages = "661--666",

editor = "BM Al-Hashimi and W Rosenstiel",

booktitle = "Proceedings Design, Automation and Test in Europe Conference and Exhibition (DATE 2011)",

note = "DATE'11 ; Conference date: 14-03-2011 Through 18-03-2011",

}

Strano, A, Gomez, C, Ludovici, D, Favalli, M, Gomez, ME & Bertozzi, D 2011, Exploiting Network-on-Chip Structural Redundancy for a Cooperative and Scalable Built-In Self-Test Architecture. in BM Al-Hashimi & W Rosenstiel (eds), Proceedings Design, Automation and Test in Europe Conference and Exhibition (DATE 2011). IEEE Society, Piscataway, NJ, USA, pp. 661-666, DATE'11, 14/03/11.

Exploiting Network-on-Chip Structural Redundancy for a Cooperative and Scalable Built-In Self-Test Architecture. / Strano, A; Gomez, C; Ludovici, D et al.
Proceedings Design, Automation and Test in Europe Conference and Exhibition (DATE 2011). ed. / BM Al-Hashimi; W Rosenstiel. Piscataway, NJ, USA: IEEE Society, 2011. p. 661-666.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Exploiting Network-on-Chip Structural Redundancy for a Cooperative and Scalable Built-In Self-Test Architecture

AU - Strano, A

AU - Gomez, C

AU - Ludovici, D

AU - Favalli, M

AU - Gomez, ME

AU - Bertozzi, D

PY - 2011

Y1 - 2011

KW - Elektrotechniek

KW - Techniek

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-3-9810801-7-9

SP - 661

EP - 666

BT - Proceedings Design, Automation and Test in Europe Conference and Exhibition (DATE 2011)

A2 - Al-Hashimi, BM

A2 - Rosenstiel, W

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - DATE'11

Y2 - 14 March 2011 through 18 March 2011

ER -