Facilitating automatic test pattern generators using test point insertion

MJ Geuzebroek, AJ van de Goor Ph D, JT van Linden

Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

Original languageUndefined/Unknown
Title of host publicationGlobal Semiconductor Manufacturing Technology
PublisherBusiness Briefing
Pages149-152
ISBN (Print)190315037X
Publication statusPublished - 2001

Keywords

  • ZX Int.klas.verslagjaar < 2002

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