Failure and delamination in microelectronic packages

M Sadeghinia

Research output: Thesis › Dissertation (TU Delft)

Original language	English
Qualification	Doctor of Philosophy
Awarding Institution	Delft University of Technology
Supervisors/Advisors	Ernst, Leo, Supervisor Jansen, K.M.B., Advisor
Award date	26 Feb 2013
Print ISBNs	978-94-6186-116-0
DOIs	https://doi.org/10.4233/uuid:9141f50e-5362-4b01-b06f-f1cc3acd6543
Publication status	Published - 2013

Keywords

@phdthesis{234a94c539c243c3baf60dbbff1b45af,

title = "Failure and delamination in microelectronic packages",

keywords = "Diss. prom. aan TU Delft",

author = "M Sadeghinia",

year = "2013",

doi = "10.4233/uuid:9141f50e-5362-4b01-b06f-f1cc3acd6543",

language = "English",

isbn = "978-94-6186-116-0",

type = "Dissertation (TU Delft)",

school = "Delft University of Technology",

}