• C Regard
  • C Gautier
  • H Frémont
  • P Poirier
  • X Ma
  • KMB Jansen
For the purpose of rapidly identifying the functional weak points of SiP products and defining appropriate design rules, a new methodology is proposed to achieve fast reliability qualification.
Original languageUndefined/Unknown
Pages (from-to)958-962
Number of pages5
JournalMicroelectronics Reliability
Volume49
Issue number2009
Publication statusPublished - 2009

    Research areas

  • academic journal papers, CWTS JFIS < 0.75

ID: 2361239