Abstract
For the purpose of rapidly identifying the functional weak points of SiP products and defining appropriate design rules, a new methodology is proposed to achieve fast reliability qualification.
Original language | Undefined/Unknown |
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Pages (from-to) | 958-962 |
Number of pages | 5 |
Journal | Microelectronics Reliability |
Volume | 49 |
Issue number | 2009 |
Publication status | Published - 2009 |
Keywords
- academic journal papers
- CWTS JFIS < 0.75