High Impedance Fault Detection in Real-Time and Evaluation Using Hardware-In-Loop Testing

Rishabh Bhandia; Jose J. Chavez; Miloš Cvetković; Peter Palensky

doi:10.1109/IECON.2018.8591824

High Impedance Fault Detection in Real-Time and Evaluation Using Hardware-In-Loop Testing

Rishabh Bhandia, Jose J. Chavez, Miloš Cvetković, Peter Palensky

Intelligent Electrical Power Grids

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

184 Downloads (Pure)

Abstract

High Impedance Fault (HIF) is a low fault current event which cannot always be efficiently detected or cleared by conventional protection systems. Voltage or current signal distortions are often a possible indicator of HIF signatures which need to be carefully analyzed. This paper proposes a new technique based on second-difference approach to detect signal distortions. The technique does not require large database and is computationally very lightweight. The performance of the proposed technique is compared against commercial protection relays connected in Hardware-in-Loop (HIL) mode to a Real Time Digital Simulator (RTDS) simulating HIF in an IEEE 9-bus system. Test result evaluation show that the proposed technique is accurate and dependable.

Original language	English
Title of host publication	Proceedings IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society
Place of Publication	Piscataway, NJ
Publisher	IEEE
Pages	182-187
Number of pages	6
ISBN (Electronic)	978-1-5090-6684-1
DOIs	https://doi.org/10.1109/IECON.2018.8591824
Publication status	Published - 2018
Event	IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society - Omni Shoreham Hotel, Washington D.C., United States Duration: 21 Oct 2018 → 23 Oct 2018 Conference number: 44 http://www.iecon2018.org/

Conference

Conference	IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society
Abbreviated title	IECON
Country/Territory	United States
City	Washington D.C.
Period	21/10/18 → 23/10/18
Internet address	http://www.iecon2018.org/

Bibliographical note

"Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public."

Keywords

High Impedance Fault
Power system protection
Waveform analytics
Distortion detection
Power system reliabilty

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10.1109/IECON.2018.8591824

High_Impedance_Fault_Detection_in_Real-Time_and_Evaluation_Using_Hardware-In-Loop_TestingFinal published version, 508 KB

Cite this

@inproceedings{a63a81c6ec4f4393a0edd5c9f96b919a,

title = "High Impedance Fault Detection in Real-Time and Evaluation Using Hardware-In-Loop Testing",

abstract = "High Impedance Fault (HIF) is a low fault current event which cannot always be efficiently detected or cleared by conventional protection systems. Voltage or current signal distortions are often a possible indicator of HIF signatures which need to be carefully analyzed. This paper proposes a new technique based on second-difference approach to detect signal distortions. The technique does not require large database and is computationally very lightweight. The performance of the proposed technique is compared against commercial protection relays connected in Hardware-in-Loop (HIL) mode to a Real Time Digital Simulator (RTDS) simulating HIF in an IEEE 9-bus system. Test result evaluation show that the proposed technique is accurate and dependable.",

keywords = "High Impedance Fault, Power system protection, Waveform analytics, Distortion detection, Power system reliabilty",

author = "Rishabh Bhandia and Chavez, {Jose J.} and Milo{\v s} Cvetkovi{\'c} and Peter Palensky",

note = "{"}Green Open Access added to TU Delft Institutional Repository {\textquoteleft}You share, we take care!{\textquoteright} – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.{"} ; IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society, IECON ; Conference date: 21-10-2018 Through 23-10-2018",

year = "2018",

doi = "10.1109/IECON.2018.8591824",

language = "English",

pages = "182--187",

booktitle = "Proceedings IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society",

publisher = "IEEE",

address = "United States",

url = "http://www.iecon2018.org/",

}

Bhandia, R, Chavez, JJ , Cvetković, M & Palensky, P 2018, High Impedance Fault Detection in Real-Time and Evaluation Using Hardware-In-Loop Testing. in Proceedings IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society. IEEE, Piscataway, NJ, pp. 182-187, IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society, Washington D.C., United States, 21/10/18. https://doi.org/10.1109/IECON.2018.8591824

High Impedance Fault Detection in Real-Time and Evaluation Using Hardware-In-Loop Testing. / Bhandia, Rishabh; Chavez, Jose J.; Cvetković, Miloš et al.
Proceedings IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society. Piscataway, NJ: IEEE, 2018. p. 182-187.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - High Impedance Fault Detection in Real-Time and Evaluation Using Hardware-In-Loop Testing

AU - Bhandia, Rishabh

AU - Chavez, Jose J.

AU - Cvetković, Miloš

AU - Palensky, Peter

N1 - Conference code: 44

PY - 2018

Y1 - 2018

N2 - High Impedance Fault (HIF) is a low fault current event which cannot always be efficiently detected or cleared by conventional protection systems. Voltage or current signal distortions are often a possible indicator of HIF signatures which need to be carefully analyzed. This paper proposes a new technique based on second-difference approach to detect signal distortions. The technique does not require large database and is computationally very lightweight. The performance of the proposed technique is compared against commercial protection relays connected in Hardware-in-Loop (HIL) mode to a Real Time Digital Simulator (RTDS) simulating HIF in an IEEE 9-bus system. Test result evaluation show that the proposed technique is accurate and dependable.

AB - High Impedance Fault (HIF) is a low fault current event which cannot always be efficiently detected or cleared by conventional protection systems. Voltage or current signal distortions are often a possible indicator of HIF signatures which need to be carefully analyzed. This paper proposes a new technique based on second-difference approach to detect signal distortions. The technique does not require large database and is computationally very lightweight. The performance of the proposed technique is compared against commercial protection relays connected in Hardware-in-Loop (HIL) mode to a Real Time Digital Simulator (RTDS) simulating HIF in an IEEE 9-bus system. Test result evaluation show that the proposed technique is accurate and dependable.

KW - High Impedance Fault

KW - Power system protection

KW - Waveform analytics

KW - Distortion detection

KW - Power system reliabilty

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DO - 10.1109/IECON.2018.8591824

M3 - Conference contribution

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EP - 187

BT - Proceedings IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society

PB - IEEE

CY - Piscataway, NJ

T2 - IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society

Y2 - 21 October 2018 through 23 October 2018

ER -

High Impedance Fault Detection in Real-Time and Evaluation Using Hardware-In-Loop Testing

Abstract

Conference

Bibliographical note

Keywords

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