High resolution STEM probe size dependence on probe current and beam brightness

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Proceedings of the 11th European Congress on Microscopy
Editors	M Steer
Place of Publication	Dublin, Ireland
Publisher	U.C.D. Belfield Dublin, Ireland
Pages	-
Publication status	Published - 1996
Event	11th European Congress on Microscopy - Dublin, Ireland Duration: 26 Aug 1996 → 30 Aug 1996

Name
Publisher	U.C.D. Belfield Dublin, Ireland

Conference	11th European Congress on Microscopy
Period	26/08/96 → 30/08/96

Published on CDROM,\T\T11\BARTH\HIGH_RES.PDF.

Cite this

@inproceedings{e503c8c9752d43d0ad2b9c87e90360d9,

title = "High resolution STEM probe size dependence on probe current and beam brightness",

author = "JE Barth and P Kruit",

note = "Published on CDROM,\T\T11\BARTH\HIGH_RES.PDF.; 11th European Congress on Microscopy ; Conference date: 26-08-1996 Through 30-08-1996",

year = "1996",

language = "Undefined/Unknown",

publisher = "U.C.D. Belfield Dublin, Ireland",

pages = "--",

editor = "M Steer",

booktitle = "Proceedings of the 11th European Congress on Microscopy",

}

TY - GEN

T1 - High resolution STEM probe size dependence on probe current and beam brightness

AU - Barth, JE

AU - Kruit, P

N1 - Published on CDROM,\T\T11\BARTH\HIGH_RES.PDF.

PY - 1996

Y1 - 1996

M3 - Conference contribution

SP - -

BT - Proceedings of the 11th European Congress on Microscopy

A2 - Steer, M

PB - U.C.D. Belfield Dublin, Ireland

CY - Dublin, Ireland

T2 - 11th European Congress on Microscopy

Y2 - 26 August 1996 through 30 August 1996

ER -