Sputter deposited Mg2FexSi1-x films of 250 nm thickness have been investigated by means of Mössbauer spectroscopy. While non-hydrogenated films are characterized by a quadrupole split doublet, hydrogenated regions show a singlet with reduced isomer shift. The relative areas of the spectra reflect the relation between loaded and unloaded regions prepared at the same loading conditions.

Original languageEnglish
Pages (from-to)109-112
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume434
DOIs
Publication statusPublished - 31 Aug 2018

    Research areas

  • Hydrogen storage, Mössbauer spectroscopy

ID: 46749787