Impact of Magnetic Coupling and Density on STT-MRAM Performance

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

11 Citations (Scopus)
42 Downloads (Pure)

Abstract

As a unique mechanism for MRAMs, magnetic coupling needs to be accounted for when designing memory arrays. This paper models both intra- and inter-cell magnetic coupling analytically for STT-MRAMs and investigates their impact on the write performance and retention of MTJ devices, which are the data-storing elements of STT-MRAMs. We present magnetic measurement data of MTJ devices with diameters ranging from 35 nm to 175 nm, which we use to calibrate our intra-cell magnetic coupling model. Subsequently, we extrapolate this model to study inter-cell magnetic coupling in memory arrays. We propose the inter-cell magnetic coupling factor Ψ to indicate coupling strength. Our simulation results show that Ψ≈2% maximizes the array density under the constraint that the magnetic coupling has negligible impact on the device's performance. Higher array densities show significant variations in average switching time, especially at low switching voltages, caused by inter-cell magnetic coupling, and dependent on the data pattern in the cell's neighborhood. We also observe a marginal degradation of the data retention time under the influence of inter-cell magnetic coupling.
Original languageEnglish
Title of host publicationProceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020
EditorsGiorgio Di Natale, Cristiana Bolchini, Elena-Ioana Vatajelu
Place of PublicationGrenoble, France
PublisherIEEE
Pages1211-1216
Number of pages6
ISBN (Electronic)978-3-9819263-4-7
ISBN (Print)978-1-7281-4468-9
DOIs
Publication statusPublished - 2020
EventDATE 20: Design, Automation and Test in Europe Conference: virtual conference - Grenoble, France
Duration: 9 Mar 202013 Mar 2020
https://www.date-conference.com/preliminary-conference-programme

Conference

ConferenceDATE 20: Design, Automation and Test in Europe Conference
Abbreviated titleDATE 20
Country/TerritoryFrance
CityGrenoble
Period9/03/2013/03/20
Internet address

Bibliographical note

Accepted Author Manuscript

Keywords

  • STT-MRAM
  • high-density
  • magnetic coupling

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