Impact of spot defects on fault modeling and tests in dual-port memories

S Hamdioui, AJ van de Goor, D Eastwick, M Rodgers

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	ETW 2001: proceedings
Place of Publication	S.l.
Publisher	s.n.
Pages	19-21
Number of pages	3
Publication status	Published - 2001
Event	IEEE European Test Workshop, Stockholm - S.l. Duration: 29 May 2001 → 1 Jun 2001

Name
Publisher	S.n.

Conference	IEEE European Test Workshop, Stockholm
Period	29/05/01 → 1/06/01

Keywords

@inproceedings{96983e9ff1c94360b32519822790fcec,

title = "Impact of spot defects on fault modeling and tests in dual-port memories",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "S Hamdioui and {van de Goor}, AJ and D Eastwick and M Rodgers",

year = "2001",

language = "Undefined/Unknown",

publisher = "s.n.",

pages = "19--21",

booktitle = "ETW 2001: proceedings",

note = "IEEE European Test Workshop, Stockholm ; Conference date: 29-05-2001 Through 01-06-2001",

}

TY - GEN

T1 - Impact of spot defects on fault modeling and tests in dual-port memories

AU - Hamdioui, S

AU - van de Goor, AJ

AU - Eastwick, D

AU - Rodgers, M

PY - 2001

Y1 - 2001

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SP - 19

EP - 21

BT - ETW 2001: proceedings

PB - s.n.

CY - S.l.

T2 - IEEE European Test Workshop, Stockholm

Y2 - 29 May 2001 through 1 June 2001

ER -