Impact of stresses on the fault coverage of memory tests

S Hamdioui; Z Al-Ars; AJ van de Goor; R Wadsworth

Impact of stresses on the fault coverage of memory tests

S Hamdioui, Z Al-Ars, AJ van de Goor, R Wadsworth

Computer Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings of the IEEE international workshop on memory technology, design and testing
Editors	s.n.
Place of Publication	Los Alamitos
Publisher	IEEE Society
Pages	103-108
Number of pages	6
ISBN (Print)	0-7695-2313-7
Publication status	Published - 2005
Event	2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05), Taipei, Taiwan - Los Alamitos Duration: 3 Aug 2005 → 5 Aug 2005

Publication series

Name
Publisher	IEEE

Conference

Conference	2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05), Taipei, Taiwan
Period	3/08/05 → 5/08/05

Bibliographical note

editors onbekend, sb

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Cite this

@inproceedings{a6e03eac08b9464db052d505f048080c,

title = "Impact of stresses on the fault coverage of memory tests",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "S Hamdioui and Z Al-Ars and {van de Goor}, AJ and R Wadsworth",

note = "editors onbekend, sb; 2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05), Taipei, Taiwan ; Conference date: 03-08-2005 Through 05-08-2005",

year = "2005",

language = "Undefined/Unknown",

isbn = "0-7695-2313-7",

publisher = "IEEE Society",

pages = "103--108",

editor = "s.n.",

booktitle = "Proceedings of the IEEE international workshop on memory technology, design and testing",

}

Hamdioui, S , Al-Ars, Z, van de Goor, AJ & Wadsworth, R 2005, Impact of stresses on the fault coverage of memory tests. in s.n. (ed.), Proceedings of the IEEE international workshop on memory technology, design and testing. IEEE Society, Los Alamitos, pp. 103-108, 2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05), Taipei, Taiwan, 3/08/05.

Impact of stresses on the fault coverage of memory tests. / Hamdioui, S ; Al-Ars, Z; van de Goor, AJ et al.
Proceedings of the IEEE international workshop on memory technology, design and testing. ed. / s.n. Los Alamitos: IEEE Society, 2005. p. 103-108.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Impact of stresses on the fault coverage of memory tests

AU - Hamdioui, S

AU - Al-Ars, Z

AU - van de Goor, AJ

AU - Wadsworth, R

N1 - editors onbekend, sb

PY - 2005

Y1 - 2005

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7695-2313-7

SP - 103

EP - 108

BT - Proceedings of the IEEE international workshop on memory technology, design and testing

A2 - s.n., null

PB - IEEE Society

CY - Los Alamitos

T2 - 2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05), Taipei, Taiwan

Y2 - 3 August 2005 through 5 August 2005

ER -