@inproceedings{86c1cfd22e554789969956a668fd2558,
title = "Importance of dynamic faults for new SRAM technologies",
keywords = "Conf.proc. > 3 pag",
author = "S Hamdioui and R Wadsworth and JD Reyes and {van de Goor}, AJ",
year = "2003",
language = "Undefined/Unknown",
isbn = "0-7695-1908-3",
publisher = "IEEE Society",
pages = "29--34",
editor = "s.n.",
booktitle = "ETW 2003; Eighth IEEE European test workshop",
note = "Eighth IEEE European test workshop, Maastricht, The Netherlands ; Conference date: 25-05-2003 Through 28-05-2003",
}