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Improving cross-validation based classifier selection using meta-learning. / Krijthe, JH; Nap, M; Loog, M.

Proceedings of 21st International Conference on Pattern Recognition (ICPR 2012). ed. / SN. Berlin, Germany : Springer, 2012. p. 2873-2867.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Harvard

Krijthe, JH, Nap, M & Loog, M 2012, Improving cross-validation based classifier selection using meta-learning. in SN (ed.), Proceedings of 21st International Conference on Pattern Recognition (ICPR 2012). Springer, Berlin, Germany, pp. 2873-2867, ICPR 2012, 11/11/12.

APA

Krijthe, JH., Nap, M., & Loog, M. (2012). Improving cross-validation based classifier selection using meta-learning. In SN (Ed.), Proceedings of 21st International Conference on Pattern Recognition (ICPR 2012) (pp. 2873-2867). Berlin, Germany: Springer.

Vancouver

Krijthe JH, Nap M, Loog M. Improving cross-validation based classifier selection using meta-learning. In SN, editor, Proceedings of 21st International Conference on Pattern Recognition (ICPR 2012). Berlin, Germany: Springer. 2012. p. 2873-2867

Author

Krijthe, JH ; Nap, M ; Loog, M. / Improving cross-validation based classifier selection using meta-learning. Proceedings of 21st International Conference on Pattern Recognition (ICPR 2012). editor / SN. Berlin, Germany : Springer, 2012. pp. 2873-2867

BibTeX

@inproceedings{3f7bfd9278644a27b7e7fded1e76c37e,
title = "Improving cross-validation based classifier selection using meta-learning",
keywords = "conference contrib. refereed, Conf.proc. > 3 pag",
author = "JH Krijthe and M Nap and M Loog",
year = "2012",
language = "English",
isbn = "978-4-9906441-1-6",
publisher = "Springer",
pages = "2873--2867",
editor = "SN",
booktitle = "Proceedings of 21st International Conference on Pattern Recognition (ICPR 2012)",

}

RIS

TY - GEN

T1 - Improving cross-validation based classifier selection using meta-learning

AU - Krijthe, JH

AU - Nap, M

AU - Loog, M

PY - 2012

Y1 - 2012

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-4-9906441-1-6

SP - 2873

EP - 2867

BT - Proceedings of 21st International Conference on Pattern Recognition (ICPR 2012)

A2 - SN, null

PB - Springer

CY - Berlin, Germany

ER -

ID: 3548034