In situ TEM electrical measurements of semiconductor and metal nanowires

Mariya Neklyudova

    Research output: ThesisDissertation (TU Delft)

    158 Downloads (Pure)
    Original languageEnglish
    Awarding Institution
    • Delft University of Technology
    Supervisors/Advisors
    • Zandbergen, Henny, Supervisor
    Award date5 Jul 2016
    Print ISBNs9789085932567
    DOIs
    Publication statusPublished - 5 Jul 2016

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