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Industrial Evaluation of Transition Fault Testing for Cost Effective Offline Adaptive Voltage Scaling. / Zandrahimi, Mahroo; Debaud, Philippe; Castillejo, Armand; Al-Ars, Zaid.

Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings. IEEE, 2018. p. 289-292.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Harvard

Zandrahimi, M, Debaud, P, Castillejo, A & Al-Ars, Z 2018, Industrial Evaluation of Transition Fault Testing for Cost Effective Offline Adaptive Voltage Scaling. in Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings. IEEE, pp. 289-292, Design, Automation and Test in Europe, Dresden, Germany, 19/03/18. https://doi.org/10.23919/DATE.2018.8342022

APA

Zandrahimi, M., Debaud, P., Castillejo, A., & Al-Ars, Z. (2018). Industrial Evaluation of Transition Fault Testing for Cost Effective Offline Adaptive Voltage Scaling. In Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings (pp. 289-292). IEEE. https://doi.org/10.23919/DATE.2018.8342022

Vancouver

Zandrahimi M, Debaud P, Castillejo A, Al-Ars Z. Industrial Evaluation of Transition Fault Testing for Cost Effective Offline Adaptive Voltage Scaling. In Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings. IEEE. 2018. p. 289-292 https://doi.org/10.23919/DATE.2018.8342022

Author

Zandrahimi, Mahroo ; Debaud, Philippe ; Castillejo, Armand ; Al-Ars, Zaid. / Industrial Evaluation of Transition Fault Testing for Cost Effective Offline Adaptive Voltage Scaling. Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings. IEEE, 2018. pp. 289-292

BibTeX

@inproceedings{b18dc8b5f4924a42a572e41e36579f42,
title = "Industrial Evaluation of Transition Fault Testing for Cost Effective Offline Adaptive Voltage Scaling",
abstract = "Adaptive voltage scaling (AVS) has been used widely to compensate for process, voltage, and temperature variations as well as power optimization of integrated circuits. Thecurrent industrial state-of-the-art AVS approaches using Process Monitoring Boxes (PMBs) have shown several limitations such as huge characterization effort, which makes these approaches very expensive, and a low accuracy that results in extra margins, which consequently lead to yield loss and performance limitations.To overcome those limitations, in this paper we propose an alternative solution using transition fault test patterns, which is able to eliminate the need for PMBs, while improving the accuracy of voltage estimation. The paper shows, using simulation of ISCAS{\textquoteright}99 benchmarks with 28nm FD-SOI library, that AVS using transition fault testing (TF-based AVS) results in an error as low as 5.33%. The paper also shows that the PMB approach can only account for 85% of the uncertainty in voltage measurements, which results in power waste, while the TF-based approach can account for 99% of that uncertainty.",
author = "Mahroo Zandrahimi and Philippe Debaud and Armand Castillejo and Zaid Al-Ars",
year = "2018",
doi = "10.23919/DATE.2018.8342022",
language = "English",
pages = "289--292",
booktitle = "Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)",
publisher = "IEEE",
address = "United States",
note = "Design, Automation and Test in Europe : DATE 2018 ; Conference date: 19-03-2018 Through 23-03-2018",

}

RIS

TY - GEN

T1 - Industrial Evaluation of Transition Fault Testing for Cost Effective Offline Adaptive Voltage Scaling

AU - Zandrahimi, Mahroo

AU - Debaud, Philippe

AU - Castillejo, Armand

AU - Al-Ars, Zaid

PY - 2018

Y1 - 2018

N2 - Adaptive voltage scaling (AVS) has been used widely to compensate for process, voltage, and temperature variations as well as power optimization of integrated circuits. Thecurrent industrial state-of-the-art AVS approaches using Process Monitoring Boxes (PMBs) have shown several limitations such as huge characterization effort, which makes these approaches very expensive, and a low accuracy that results in extra margins, which consequently lead to yield loss and performance limitations.To overcome those limitations, in this paper we propose an alternative solution using transition fault test patterns, which is able to eliminate the need for PMBs, while improving the accuracy of voltage estimation. The paper shows, using simulation of ISCAS’99 benchmarks with 28nm FD-SOI library, that AVS using transition fault testing (TF-based AVS) results in an error as low as 5.33%. The paper also shows that the PMB approach can only account for 85% of the uncertainty in voltage measurements, which results in power waste, while the TF-based approach can account for 99% of that uncertainty.

AB - Adaptive voltage scaling (AVS) has been used widely to compensate for process, voltage, and temperature variations as well as power optimization of integrated circuits. Thecurrent industrial state-of-the-art AVS approaches using Process Monitoring Boxes (PMBs) have shown several limitations such as huge characterization effort, which makes these approaches very expensive, and a low accuracy that results in extra margins, which consequently lead to yield loss and performance limitations.To overcome those limitations, in this paper we propose an alternative solution using transition fault test patterns, which is able to eliminate the need for PMBs, while improving the accuracy of voltage estimation. The paper shows, using simulation of ISCAS’99 benchmarks with 28nm FD-SOI library, that AVS using transition fault testing (TF-based AVS) results in an error as low as 5.33%. The paper also shows that the PMB approach can only account for 85% of the uncertainty in voltage measurements, which results in power waste, while the TF-based approach can account for 99% of that uncertainty.

U2 - 10.23919/DATE.2018.8342022

DO - 10.23919/DATE.2018.8342022

M3 - Conference contribution

SP - 289

EP - 292

BT - Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)

PB - IEEE

T2 - Design, Automation and Test in Europe

Y2 - 19 March 2018 through 23 March 2018

ER -

ID: 45596462