@article{168662ae537942978138f57b209859fe,
title = "Influence of bit line coupling and twisting on the faulty behavior of DRAMs",
keywords = "academic journal papers, CWTS JFIS < 0.75",
author = "Z Al-Ars and S Hamdioui and {van de Goor}, AJ and S Al-Harbi",
year = "2006",
language = "Undefined/Unknown",
volume = "25",
pages = "2989--2996",
journal = "IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems",
issn = "0278-0070",
publisher = "Institute of Electrical and Electronics Engineers (IEEE)",
number = "12",
}