Information theoretic preattentive saliency

M Loog

doi:10.1109/ICCVW.2011.6130417

Information theoretic preattentive saliency

Pattern Recognition and Bioinformatics

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	2011 IEEE International Conference on Computer Vision Workshops
Editors	F Escolano, A Rangarajan, AL Yuille, ER Hancock
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	1418-1424
Number of pages	7
ISBN (Print)	978-1-4673-0063-6
DOIs	https://doi.org/10.1109/ICCVW.2011.6130417
Publication status	Published - 2011
Event	2011 IEEE International Conference on Computer Vision Workshops - Piscataway, NJ, USA Duration: 6 Nov 2011 → 13 Nov 2011

Publication series

Name
Publisher	IEEE

Conference

Conference	2011 IEEE International Conference on Computer Vision Workshops
Period	6/11/11 → 13/11/11

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Access to Document

10.1109/ICCVW.2011.6130417

Cite this

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title = "Information theoretic preattentive saliency",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "M Loog",

year = "2011",

doi = "10.1109/ICCVW.2011.6130417",

language = "English",

isbn = "978-1-4673-0063-6",

publisher = "IEEE Society",

pages = "1418--1424",

editor = "F Escolano and A Rangarajan and AL Yuille and ER Hancock",

booktitle = "2011 IEEE International Conference on Computer Vision Workshops",

note = "2011 IEEE International Conference on Computer Vision Workshops ; Conference date: 06-11-2011 Through 13-11-2011",

}

TY - GEN

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AU - Loog, M

PY - 2011

Y1 - 2011

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

U2 - 10.1109/ICCVW.2011.6130417

DO - 10.1109/ICCVW.2011.6130417

M3 - Conference contribution

SN - 978-1-4673-0063-6

SP - 1418

EP - 1424

BT - 2011 IEEE International Conference on Computer Vision Workshops

A2 - Escolano, F

A2 - Rangarajan, A

A2 - Yuille, AL

A2 - Hancock, ER

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - 2011 IEEE International Conference on Computer Vision Workshops

Y2 - 6 November 2011 through 13 November 2011

ER -