@inproceedings{1ce579e5914241bd927258fc1a25544d,
title = "Integral impact of BTI and voltage temperature variation on SRAM sense amplifier",
author = "IO Agbo and M Taouil and S Hamdioui and H Kukner and P Weckx and P Raghavan and F Catthoor",
note = "Harvest Article number: 7116291; VTS 2015, Napa, CA, USA ; Conference date: 27-04-2015 Through 29-04-2015",
year = "2015",
doi = "10.1109/VTS.2015.7116291",
language = "English",
isbn = "978-1-4799-7597-6",
publisher = "IEEE Society",
pages = "1--6",
editor = "C Thibeault and L Anghel",
booktitle = "Proceedings - 33rd IEEE VLSI Test Symposium",
}