Layout-based refined NPSF model for DRAM characterization and testing

Y Sfikas, YE Tsiatouhas, S Hamdioui

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)
Original languageEnglish
Pages (from-to)1446-1450
Number of pages5
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume22
Issue number6
DOIs
Publication statusPublished - 2014

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