TY - JOUR
T1 - Localization Techniques of Partial Discharges at Cable Ends in Off-line Single-Sided Partial Discharge Cable Measurements
AU - Mor, A. Rodrigo
AU - Morshuis, P. H F
AU - Llovera, P
AU - Fuster, V
AU - Quijano, A
PY - 2016/2
Y1 - 2016/2
N2 - Partial discharge (PD) field tests are widely used for cable assessment or cable commissioning. Usually, these tests are carried out by means of off-line tests where PD pulses are measured with capacitively coupled PD sensors. In off-line single-sided cable measurements, time-domain reflectometry (TDR) is used to locate the source of the PD along the cable. However, when the PD pulses are originated at the cable ends, the TDR technique cannot, by itself, properly distinguish between PD pulses produced at the cable near-end or at the far-end. This paper describes three different methods that produce an unambiguous localization of PDs produced at the cable ends, complementing the TDR.
AB - Partial discharge (PD) field tests are widely used for cable assessment or cable commissioning. Usually, these tests are carried out by means of off-line tests where PD pulses are measured with capacitively coupled PD sensors. In off-line single-sided cable measurements, time-domain reflectometry (TDR) is used to locate the source of the PD along the cable. However, when the PD pulses are originated at the cable ends, the TDR technique cannot, by itself, properly distinguish between PD pulses produced at the cable near-end or at the far-end. This paper describes three different methods that produce an unambiguous localization of PDs produced at the cable ends, complementing the TDR.
KW - capacitively coupled sensor
KW - Partial discharges
KW - time domain reflectometry
UR - http://www.scopus.com/inward/record.url?scp=84963605338&partnerID=8YFLogxK
UR - http://resolver.tudelft.nl/uuid://7cac0132-01eb-4db7-8d12-b87e75accad1
U2 - 10.1109/TDEI.2015.005395
DO - 10.1109/TDEI.2015.005395
M3 - Article
AN - SCOPUS:84963605338
SN - 1070-9878
VL - 23
SP - 428
EP - 434
JO - IEEE Transactions on Dielectrics and Electrical Insulation
JF - IEEE Transactions on Dielectrics and Electrical Insulation
IS - 1
M1 - 7422587
ER -