Logical fault detection of CMOS SRAM ICs based on write quiescent supply current

M Hashizume, T Tamesada, T Koyama, AJ van de Goor Ph D

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	906-915
Number of pages	10
Journal	Denshi Joho Tsushin Gakkai Ronbunshi. D-1/I EICE Transactions on Information and Systems, Pt.1
Volume	82
Issue number	7
Publication status	Published - 1999

Keywords

@article{d2be9f0b40954267a41214b6b984c1dd,

title = "Logical fault detection of CMOS SRAM ICs based on write quiescent supply current",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "M Hashizume and T Tamesada and T Koyama and {van de Goor Ph D}, AJ",

year = "1999",

language = "Undefined/Unknown",

volume = "82",

pages = "906--915",

journal = "Denshi Joho Tsushin Gakkai Ronbunshi. D-1/I EICE Transactions on Information and Systems, Pt.1",

issn = "0915-1915",

number = "7",

}

TY - JOUR

T1 - Logical fault detection of CMOS SRAM ICs based on write quiescent supply current

AU - Hashizume, M

AU - Tamesada, T

AU - Koyama, T

AU - van de Goor Ph D, AJ

PY - 1999

Y1 - 1999

KW - ZX Int.klas.verslagjaar < 2002

M3 - Article

SN - 0915-1915

VL - 82

SP - 906

EP - 915

JO - Denshi Joho Tsushin Gakkai Ronbunshi. D-1/I EICE Transactions on Information and Systems, Pt.1

JF - Denshi Joho Tsushin Gakkai Ronbunshi. D-1/I EICE Transactions on Information and Systems, Pt.1

IS - 7

ER -