A full analytic time-domain analysis is presented for a canonical problem of electromagnetic interference related to the operation of integrated-circuit devices at optical frequencies, where metal screens and substrates can no longer be characterized as perfect electrical conductors, but the plasmonic behavior of conduction electrons in the metal has to be taken into account.
Original languageEnglish
Pages (from-to)885 - 889
Number of pages5
JournalIEEE Transactions on Electromagnetic Compatibility
Issue number4
Publication statusPublished - 2018

    Research areas

  • Electromagnetic interference (EMI), modified Cagniard technique, pulsed electromagnetic (EM) field transfer, shielding, time-domain (TD) analysis.

ID: 40153396