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Loop-to-Loop Pulsed Electromagnetic Signal Transfer Across a Thin Metal Screen With Drude-Type Dispersive Behavior. / Stumpf, Martin; de Hoop, Adrianus.

In: IEEE Transactions on Electromagnetic Compatibility, Vol. 60, No. 4, 2018, p. 885 - 889.

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Stumpf, Martin ; de Hoop, Adrianus. / Loop-to-Loop Pulsed Electromagnetic Signal Transfer Across a Thin Metal Screen With Drude-Type Dispersive Behavior. In: IEEE Transactions on Electromagnetic Compatibility. 2018 ; Vol. 60, No. 4. pp. 885 - 889.

BibTeX

@article{e267564e0f794568b4bacc5b57f88df2,
title = "Loop-to-Loop Pulsed Electromagnetic Signal Transfer Across a Thin Metal Screen With Drude-Type Dispersive Behavior",
abstract = "A full analytic time-domain analysis is presented for a canonical problem of electromagnetic interference related to the operation of integrated-circuit devices at optical frequencies, where metal screens and substrates can no longer be characterized as perfect electrical conductors, but the plasmonic behavior of conduction electrons in the metal has to be taken into account.",
keywords = "Electromagnetic interference (EMI), modified Cagniard technique, pulsed electromagnetic (EM) field transfer, shielding, time-domain (TD) analysis.",
author = "Martin Stumpf and {de Hoop}, Adrianus",
year = "2018",
doi = "10.1109/TEMC.2017.2754645",
language = "English",
volume = "60",
pages = "885 -- 889",
journal = "IEEE Transactions on Electromagnetic Compatibility",
issn = "0018-9375",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "4",

}

RIS

TY - JOUR

T1 - Loop-to-Loop Pulsed Electromagnetic Signal Transfer Across a Thin Metal Screen With Drude-Type Dispersive Behavior

AU - Stumpf, Martin

AU - de Hoop, Adrianus

PY - 2018

Y1 - 2018

N2 - A full analytic time-domain analysis is presented for a canonical problem of electromagnetic interference related to the operation of integrated-circuit devices at optical frequencies, where metal screens and substrates can no longer be characterized as perfect electrical conductors, but the plasmonic behavior of conduction electrons in the metal has to be taken into account.

AB - A full analytic time-domain analysis is presented for a canonical problem of electromagnetic interference related to the operation of integrated-circuit devices at optical frequencies, where metal screens and substrates can no longer be characterized as perfect electrical conductors, but the plasmonic behavior of conduction electrons in the metal has to be taken into account.

KW - Electromagnetic interference (EMI)

KW - modified Cagniard technique

KW - pulsed electromagnetic (EM) field transfer

KW - shielding

KW - time-domain (TD) analysis.

UR - http://resolver.tudelft.nl/uuid:e267564e-0f79-4568-b4ba-cc5b57f88df2

U2 - 10.1109/TEMC.2017.2754645

DO - 10.1109/TEMC.2017.2754645

M3 - Article

VL - 60

SP - 885

EP - 889

JO - IEEE Transactions on Electromagnetic Compatibility

T2 - IEEE Transactions on Electromagnetic Compatibility

JF - IEEE Transactions on Electromagnetic Compatibility

SN - 0018-9375

IS - 4

ER -

ID: 40153396