Lumen maintenance prediction for LEDs: New insights

B. Jacobs, W.D. van Driel, M. Schuld

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)
27 Downloads (Pure)

Abstract

Commercial claims for LED-based products in terms of lumen maintenance are fully based on TM-21 extrapolations using LM-80 data. We presented an approach based on statistical data analytics, following the work from Yu & Tseng, at EuroSimE2015. Since then, more LM80 test data came available both for High Power (HP) and Mid Power (MP) LEDs. In this paper, we will present the results of further investigations, where we have taken the work from Meeker into account. This is needed as some commercial claims are based on 10 years of warranty and some service bids provide periods of 20 to 25 years of operation.

Original languageEnglish
Title of host publication2018 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018
Place of PublicationPiscataway, NJ
PublisherIEEE
Pages1-4
Number of pages4
ISBN (Electronic)978-1-5386-2359-6
DOIs
Publication statusPublished - 2018
EventEuroSimE 2018: 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - Toulouse, France
Duration: 15 Apr 201818 Apr 2018

Conference

ConferenceEuroSimE 2018
Abbreviated titleEuroSimE 2018
Country/TerritoryFrance
CityToulouse
Period15/04/1818/04/18

Bibliographical note

Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

  • Light emitting diodes
  • Degradation
  • Mathematical model
  • Maintenance engineering
  • Temperature measurement
  • Life estimation
  • IEC Standards

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