March SS: A test for all static simple RAM faults

S Hamdioui; AJ van de Goor; M Rodgers

March SS: A test for all static simple RAM faults

S Hamdioui, AJ van de Goor, M Rodgers

Computer Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

116 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002)
Editors	B Courtois, T Wik, Y Zorian
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	95-100
Number of pages	6
ISBN (Print)	0-7695-1617-3
Publication status	Published - 2002
Event	The 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002) - Piscataway, NJ, USA Duration: 10 Jul 2002 → 12 Jul 2002

Publication series

Name
Publisher	IEEE

Conference

Conference	The 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002)
Period	10/07/02 → 12/07/02

Keywords

Elektrotechniek
Techniek
conference contrib. refereed
ZX Nader te bep. ivm conversie
ZX Int.klas.verslagjaar < 2002

Cite this

@inproceedings{674d7936df16490abbb8bb7a81c52ecd,

title = "March SS: A test for all static simple RAM faults",

keywords = "Elektrotechniek, Techniek, conference contrib. refereed, ZX Nader te bep. ivm conversie, ZX Int.klas.verslagjaar < 2002",

author = "S Hamdioui and {van de Goor}, AJ and M Rodgers",

year = "2002",

language = "Undefined/Unknown",

isbn = "0-7695-1617-3",

publisher = "IEEE Society",

pages = "95--100",

editor = "B Courtois and T Wik and Y Zorian",

booktitle = "Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002)",

note = "The 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002) ; Conference date: 10-07-2002 Through 12-07-2002",

}

Hamdioui, S, van de Goor, AJ & Rodgers, M 2002, March SS: A test for all static simple RAM faults. in B Courtois, T Wik & Y Zorian (eds), Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002). IEEE Society, Piscataway, NJ, USA, pp. 95-100, The 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002), 10/07/02.

March SS: A test for all static simple RAM faults. / Hamdioui, S; van de Goor, AJ; Rodgers, M.
Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002). ed. / B Courtois; T Wik; Y Zorian. Piscataway, NJ, USA: IEEE Society, 2002. p. 95-100.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - March SS: A test for all static simple RAM faults

AU - Hamdioui, S

AU - van de Goor, AJ

AU - Rodgers, M

PY - 2002

Y1 - 2002

KW - Elektrotechniek

KW - Techniek

KW - conference contrib. refereed

KW - ZX Nader te bep. ivm conversie

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7695-1617-3

SP - 95

EP - 100

BT - Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002)

A2 - Courtois, B

A2 - Wik, T

A2 - Zorian, Y

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - The 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002)

Y2 - 10 July 2002 through 12 July 2002

ER -