March tests for realistic faults in two-port memories

S Hamdioui, AJ van de Goor Ph D

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

8 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Records of the 2000 IEEE international workshop on memory technology, design and testing
Editors	R Rajsuman, T Wik
Place of Publication	Los Alamitos
Publisher	IEEE
Pages	73-78
Number of pages	6
ISBN (Print)	0-7695-0689-5
Publication status	Published - 2000
Event	International workshop on memory technology, design and testing, San Jose - Los Alamitos Duration: 7 Aug 2000 → 8 Aug 2000

Name
Publisher	IEEE Computer Society

Conference	International workshop on memory technology, design and testing, San Jose
Period	7/08/00 → 8/08/00

Keywords

@inproceedings{739a9b9d109c41ad97e533cc6461b920,

title = "March tests for realistic faults in two-port memories",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "S Hamdioui and {van de Goor Ph D}, AJ",

year = "2000",

language = "Undefined/Unknown",

isbn = "0-7695-0689-5",

publisher = "IEEE",

pages = "73--78",

editor = "{R Rajsuman} and {T Wik}",

booktitle = "Records of the 2000 IEEE international workshop on memory technology, design and testing",

address = "United States",

note = "International workshop on memory technology, design and testing, San Jose ; Conference date: 07-08-2000 Through 08-08-2000",

}

March tests for realistic faults in two-port memories. / Hamdioui, S; van de Goor Ph D, AJ.
Records of the 2000 IEEE international workshop on memory technology, design and testing. ed. / R Rajsuman; T Wik. Los Alamitos: IEEE, 2000. p. 73-78.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - March tests for realistic faults in two-port memories

AU - Hamdioui, S

AU - van de Goor Ph D, AJ

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7695-0689-5

SP - 73

EP - 78

BT - Records of the 2000 IEEE international workshop on memory technology, design and testing

A2 - R Rajsuman, null

A2 - T Wik, null

PB - IEEE

CY - Los Alamitos

T2 - International workshop on memory technology, design and testing, San Jose

Y2 - 7 August 2000 through 8 August 2000

ER -