Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: A theoretical framework

AJ den Dekker, S van Aert, A van den Bos

Research output: Contribution to journal › Article › Scientific › peer-review

Keywords

@article{d54c943c8c374668bc4fefc339973c12,

title = "Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: A theoretical framework",

keywords = "ZX CWTS 1.00 <= JFIS < 3.00",

author = "{den Dekker}, AJ and {van Aert}, S and {van den Bos}, A",

year = "2005",

language = "Undefined/Unknown",

volume = "104",

pages = "83--106",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

number = "2",

}