Memory profiling for intra-application data-communication quantification: A survey

I Ashraf; M Taouil; K Bertels

doi:10.1109/IDT.2015.7396732

Memory profiling for intra-application data-communication quantification: A survey

I Ashraf, M Taouil, K Bertels

Computer Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

4 Citations (Scopus)

Original language	English
Title of host publication	Proceedings of the 10th International Design and Test Symposium
Editors	F Kurdahi, S Mir, MO Yu
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	32-37
Number of pages	6
ISBN (Print)	978-1-4673-9993-4
DOIs	https://doi.org/10.1109/IDT.2015.7396732
Publication status	Published - 2015
Event	IDT 2015: 10th International Design and Test Symposium - Amman, Jordan Duration: 14 Dec 2015 → 16 Dec 2015 Conference number: 10

Publication series

Name
Publisher	IEEE

Conference

Conference	IDT 2015
Country/Territory	Jordan
City	Amman
Period	14/12/15 → 16/12/15

Bibliographical note

harvest

Access to Document

10.1109/IDT.2015.7396732

Cite this

@inproceedings{cd20395118ad4fc19d7991e39cfc4dbd,

title = "Memory profiling for intra-application data-communication quantification: A survey",

author = "I Ashraf and M Taouil and K Bertels",

note = "harvest; IDT 2015 : 10th International Design and Test Symposium ; Conference date: 14-12-2015 Through 16-12-2015",

year = "2015",

doi = "10.1109/IDT.2015.7396732",

language = "English",

isbn = "978-1-4673-9993-4",

publisher = "IEEE Society",

pages = "32--37",

editor = "F Kurdahi and S Mir and MO Yu",

booktitle = "Proceedings of the 10th International Design and Test Symposium",

}

Memory profiling for intra-application data-communication quantification: A survey. / Ashraf, I; Taouil, M; Bertels, K.
Proceedings of the 10th International Design and Test Symposium. ed. / F Kurdahi; S Mir; MO Yu. Piscataway: IEEE Society, 2015. p. 32-37.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Memory profiling for intra-application data-communication quantification: A survey

AU - Ashraf, I

AU - Taouil, M

AU - Bertels, K

N1 - Conference code: 10

PY - 2015

Y1 - 2015

U2 - 10.1109/IDT.2015.7396732

DO - 10.1109/IDT.2015.7396732

M3 - Conference contribution

SN - 978-1-4673-9993-4

SP - 32

EP - 37

BT - Proceedings of the 10th International Design and Test Symposium

A2 - Kurdahi, F

A2 - Mir, S

A2 - Yu, MO

PB - IEEE Society

CY - Piscataway

T2 - IDT 2015

Y2 - 14 December 2015 through 16 December 2015

ER -