Standard

Memory testing with a RISC microcontroller. / van de Goor, AJ; Gaydadjiev, GN; Hamdioui, S.

Design, automation & test in Europe 2010. ed. / s.n. Piscataway : IEEE Society, 2010. p. 214-219.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Harvard

van de Goor, AJ, Gaydadjiev, GN & Hamdioui, S 2010, Memory testing with a RISC microcontroller. in s.n. (ed.), Design, automation & test in Europe 2010. IEEE Society, Piscataway, pp. 214-219, DATE 2010, 8/03/10.

APA

van de Goor, AJ., Gaydadjiev, GN., & Hamdioui, S. (2010). Memory testing with a RISC microcontroller. In s.n. (Ed.), Design, automation & test in Europe 2010 (pp. 214-219). Piscataway: IEEE Society.

Vancouver

van de Goor AJ, Gaydadjiev GN, Hamdioui S. Memory testing with a RISC microcontroller. In s.n., editor, Design, automation & test in Europe 2010. Piscataway: IEEE Society. 2010. p. 214-219

Author

van de Goor, AJ ; Gaydadjiev, GN ; Hamdioui, S. / Memory testing with a RISC microcontroller. Design, automation & test in Europe 2010. editor / s.n. Piscataway : IEEE Society, 2010. pp. 214-219

BibTeX

@inproceedings{0d26e4340f3e4161aab7dbe4aad7f899,
title = "Memory testing with a RISC microcontroller",
keywords = "Conf.proc. > 3 pag",
author = "{van de Goor}, AJ and GN Gaydadjiev and S Hamdioui",
year = "2010",
language = "English",
isbn = "978-3-9810801-6-2",
publisher = "IEEE Society",
pages = "214--219",
editor = "s.n.",
booktitle = "Design, automation & test in Europe 2010",

}

RIS

TY - GEN

T1 - Memory testing with a RISC microcontroller

AU - van de Goor, AJ

AU - Gaydadjiev, GN

AU - Hamdioui, S

PY - 2010

Y1 - 2010

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-3-9810801-6-2

SP - 214

EP - 219

BT - Design, automation & test in Europe 2010

A2 - s.n., null

PB - IEEE Society

CY - Piscataway

ER -

ID: 3708839