The Hamaker constant between graphene oxide and silica, which quantifies the strength of van der Waals forces is determined, by mimicking a “vacuum spacer” in an atomic force microscopyforce study. It is demonstrated that, a 2D spacer is expected to yield an accurately defined separation, owing to the high atom density and strength in planar direction compared with other dimensional spacers.
Original languageEnglish
Article number1600495
Pages (from-to)1-5
Number of pages5
JournalAdvanced Materials Interfaces
Issue number5
Publication statusPublished - 2017

    Research areas

  • 2D materials, Atomic force microscopy, Graphene oxide, Hamaker constant, Vacuum spacers

ID: 10084828