@inproceedings{d35a6aed28594c888490e500e19d12f1,
title = "Minimal test for coupling faults in word-oriented memories",
keywords = "Elektrotechniek, Techniek, conference contrib. refereed, Conf.proc. > 3 pag, ZX Int.klas.verslagjaar < 2002",
author = "{van de Goor}, AJ and MS Abadir and JF Carlin",
year = "2002",
language = "Undefined/Unknown",
isbn = "0-7695-1471-5",
publisher = "IEEE",
pages = "944--948",
editor = "{Delgado Kloos}, C and {da Franca}, J",
booktitle = "DATE 02; Design, automation and test in Europe",
address = "United States",
note = "DATE 02; Design, automation and test in Europe ; Conference date: 04-03-2002 Through 08-03-2002",
}