NBTI Monitoring and Design for Reliability in Nanoscale Circuits

MSK Seyab; NZB Haron; S Hamdioui; F Catthoor

doi:10.1109/DFT.2011.49

NBTI Monitoring and Design for Reliability in Nanoscale Circuits

MSK Seyab, NZB Haron, S Hamdioui, F Catthoor

Computer Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

24 Citations (Scopus)

Original language	English
Title of host publication	IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2011)
Editors	G Chapman, F Salice, PD Joshi, M Violante
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	68-76
Number of pages	9
DOIs	https://doi.org/10.1109/DFT.2011.49
Publication status	Published - 2011
Event	DFT 2011 - Piscataway, NJ, USA Duration: 3 Oct 2011 → 5 Oct 2011

Publication series

Name
Publisher	IEEE

Conference

Conference	DFT 2011
Period	3/10/11 → 5/10/11

Access to Document

10.1109/DFT.2011.49

Cite this

@inproceedings{ae860f12efb54296a8dd264468ecaf4e,

title = "NBTI Monitoring and Design for Reliability in Nanoscale Circuits",

author = "MSK Seyab and NZB Haron and S Hamdioui and F Catthoor",

year = "2011",

doi = "10.1109/DFT.2011.49",

language = "English",

publisher = "IEEE Society",

pages = "68--76",

editor = "G Chapman and F Salice and PD Joshi and M Violante",

booktitle = "IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2011)",

note = "DFT 2011 ; Conference date: 03-10-2011 Through 05-10-2011",

}

NBTI Monitoring and Design for Reliability in Nanoscale Circuits. / Seyab, MSK; Haron, NZB; Hamdioui, S et al.
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2011). ed. / G Chapman; F Salice; PD Joshi; M Violante. Piscataway, NJ, USA: IEEE Society, 2011. p. 68-76.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - NBTI Monitoring and Design for Reliability in Nanoscale Circuits

AU - Seyab, MSK

AU - Haron, NZB

AU - Hamdioui, S

AU - Catthoor, F

PY - 2011

Y1 - 2011

U2 - 10.1109/DFT.2011.49

DO - 10.1109/DFT.2011.49

M3 - Conference contribution

SP - 68

EP - 76

BT - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2011)

A2 - Chapman, G

A2 - Salice, F

A2 - Joshi, PD

A2 - Violante, M

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - DFT 2011

Y2 - 3 October 2011 through 5 October 2011

ER -