DOI

  • V Jovanovic
  • C Biasotto
  • LK Nanver
  • J Moers
  • D Gruetzmacher
  • J Gerharz
  • G Mussler
  • J van der Cingel
  • J Zhang
  • G Bauer
  • OG Schmidt
  • L Miglio
Original languageEnglish
Pages (from-to)1083-1085
Number of pages3
JournalIEEE Electron Device Letters
Volume31
Issue number10
DOIs
Publication statusPublished - 2010

    Research areas

  • CWTS JFIS >= 2.00

ID: 3775228