New application of classical x-ray diffraction methods for epitaxial film characterization

WJAM Peterse, PMLO Scholte, AJ Steinfort, F Tuinstra

Research output: Contribution to journal › Article › Scientific › peer-review

Cite this

@article{c74cf33f9fc84c819138314fb9b34862,

title = "New application of classical x-ray diffraction methods for epitaxial film characterization",

author = "WJAM Peterse and PMLO Scholte and AJ Steinfort and F Tuinstra",

year = "1996",

language = "Undefined/Unknown",

volume = "289",

pages = "49--53",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

}