Standard

Non-Euclidean dissimilarities: causes, embedding and informativeness. / Duin, RPW; Pekalska, E; Loog, M.

Similarity-based pattern analysis and recognition. ed. / M Pelillo. Berlin, Germany : Springer, 2013. p. 13-44.

Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

Harvard

Duin, RPW, Pekalska, E & Loog, M 2013, Non-Euclidean dissimilarities: causes, embedding and informativeness. in M Pelillo (ed.), Similarity-based pattern analysis and recognition. Springer, Berlin, Germany, pp. 13-44.

APA

Duin, RPW., Pekalska, E., & Loog, M. (2013). Non-Euclidean dissimilarities: causes, embedding and informativeness. In M. Pelillo (Ed.), Similarity-based pattern analysis and recognition (pp. 13-44). Berlin, Germany: Springer.

Vancouver

Duin RPW, Pekalska E, Loog M. Non-Euclidean dissimilarities: causes, embedding and informativeness. In Pelillo M, editor, Similarity-based pattern analysis and recognition. Berlin, Germany: Springer. 2013. p. 13-44

Author

Duin, RPW ; Pekalska, E ; Loog, M. / Non-Euclidean dissimilarities: causes, embedding and informativeness. Similarity-based pattern analysis and recognition. editor / M Pelillo. Berlin, Germany : Springer, 2013. pp. 13-44

BibTeX

@inbook{f5cbb050ee4e4d2ebc117ccc9ebbadf4,
title = "Non-Euclidean dissimilarities: causes, embedding and informativeness",
keywords = "edited works: contributions, Boekdeel internat.wet",
author = "RPW Duin and E Pekalska and M Loog",
year = "2013",
language = "English",
isbn = "978-1-4471-5627-7",
pages = "13--44",
editor = "M Pelillo",
booktitle = "Similarity-based pattern analysis and recognition",
publisher = "Springer",

}

RIS

TY - CHAP

T1 - Non-Euclidean dissimilarities: causes, embedding and informativeness

AU - Duin, RPW

AU - Pekalska, E

AU - Loog, M

PY - 2013

Y1 - 2013

KW - edited works: contributions

KW - Boekdeel internat.wet

UR - http://link.springer.com/chapter/10.1007%2F978-1-4471-5628-4_2

M3 - Chapter

SN - 978-1-4471-5627-7

SP - 13

EP - 44

BT - Similarity-based pattern analysis and recognition

A2 - Pelillo, M

PB - Springer

CY - Berlin, Germany

ER -

ID: 2582965