On the Use of Data Flow Analysis in Static Profiling

CJ Boogerd; LMF Moonen

On the Use of Data Flow Analysis in Static Profiling

CJ Boogerd, LMF Moonen

Software Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

8 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings of the Eighth IEEE International Working Conference on Source Code Analysis and Manipulation
Editors	J Cordy, L Zhang
Place of Publication	Los Alamitos, USA
Publisher	IEEE
Pages	79-88
Number of pages	10
Publication status	Published - 2008
Event	8th IEEE International Working Conference on Source Code Analysis and Manipulation (SCAM 2008) - Los Alamitos, USA Duration: 28 Sept 2008 → 29 Sept 2008

Publication series

Name
Publisher	IEEE Computer Society

Conference

Conference	8th IEEE International Working Conference on Source Code Analysis and Manipulation (SCAM 2008)
Period	28/09/08 → 29/09/08

Bibliographical note

BoogerdM08-2

Keywords

Conf.proc. > 3 pag

Cite this

@inproceedings{24b059c75e2149b8ac0bbe26c9113322,

title = "On the Use of Data Flow Analysis in Static Profiling",

keywords = "Conf.proc. > 3 pag",

author = "CJ Boogerd and LMF Moonen",

note = "BoogerdM08-2; 8th IEEE International Working Conference on Source Code Analysis and Manipulation (SCAM 2008) ; Conference date: 28-09-2008 Through 29-09-2008",

year = "2008",

language = "Undefined/Unknown",

publisher = "IEEE",

pages = "79--88",

editor = "J Cordy and L Zhang",

booktitle = "Proceedings of the Eighth IEEE International Working Conference on Source Code Analysis and Manipulation",

address = "United States",

}

On the Use of Data Flow Analysis in Static Profiling. / Boogerd, CJ; Moonen, LMF.
Proceedings of the Eighth IEEE International Working Conference on Source Code Analysis and Manipulation. ed. / J Cordy; L Zhang. Los Alamitos, USA: IEEE, 2008. p. 79-88.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - On the Use of Data Flow Analysis in Static Profiling

AU - Boogerd, CJ

AU - Moonen, LMF

N1 - BoogerdM08-2

PY - 2008

Y1 - 2008

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 79

EP - 88

BT - Proceedings of the Eighth IEEE International Working Conference on Source Code Analysis and Manipulation

A2 - Cordy, J

A2 - Zhang, L

PB - IEEE

CY - Los Alamitos, USA

T2 - 8th IEEE International Working Conference on Source Code Analysis and Manipulation (SCAM 2008)

Y2 - 28 September 2008 through 29 September 2008

ER -