Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards

F. Mubarak; V. Mascolo; G. Rietveld; M. Spirito; K. Daffe; K. Haddadi

doi:10.1109/CPEM.2018.8500810

Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards

F. Mubarak, V. Mascolo, G. Rietveld, M. Spirito, K. Daffe, K. Haddadi

Electronics

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Abstract

Methods for traceable characterization and uncertainty evaluation of planar I-port CPW short-open-Ioad (SOL) devices are developed. The agreement of modelling and verification measurement results greatly supports the application of the proposed parameterization models and used FEM-based EM modelling of CPW structures for traceable characterization of planar CPW-based SOL devices in the frequency range between a few kHz up to 50 GHz.

Original language	English
Title of host publication	CPEM 2018 - Conference on Precision Electromagnetic Measurements
Editors	Philip Tuckey, François Piquemal, Olivier Thévenot
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Number of pages	2
ISBN (Electronic)	978-1-5386-0973-6
DOIs	https://doi.org/10.1109/CPEM.2018.8500810
Publication status	Published - 2018
Event	2018 Conference on Precision Electromagnetic Measurements, CPEM 2018 - Paris, France Duration: 8 Jul 2018 → 13 Jul 2018

Conference

Conference	2018 Conference on Precision Electromagnetic Measurements, CPEM 2018
Country/Territory	France
City	Paris
Period	8/07/18 → 13/07/18

Keywords

co-planar waveguide
EM simulation
measurement uncertainty
nanostructures
on-wafer calibration
precision measurements
traceability
VNA

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10.1109/CPEM.2018.8500810

Cite this

Mubarak, F., Mascolo, V., Rietveld, G., Spirito, M., Daffe, K., & Haddadi, K. (2018). Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards. In P. Tuckey, F. Piquemal, & O. Thévenot (Eds.), CPEM 2018 - Conference on Precision Electromagnetic Measurements Article 8500810 Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/CPEM.2018.8500810

@inproceedings{d0a81e74340c4e789c0e92ac8f8dd3da,

title = "Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards",

abstract = "Methods for traceable characterization and uncertainty evaluation of planar I-port CPW short-open-Ioad (SOL) devices are developed. The agreement of modelling and verification measurement results greatly supports the application of the proposed parameterization models and used FEM-based EM modelling of CPW structures for traceable characterization of planar CPW-based SOL devices in the frequency range between a few kHz up to 50 GHz.",

keywords = "co-planar waveguide, EM simulation, measurement uncertainty, nanostructures, on-wafer calibration, precision measurements, traceability, VNA",

author = "F. Mubarak and V. Mascolo and G. Rietveld and M. Spirito and K. Daffe and K. Haddadi",

year = "2018",

doi = "10.1109/CPEM.2018.8500810",

language = "English",

editor = "Tuckey, {Philip } and Piquemal, {Fran{\c c}ois } and {Th{\'e}venot }, {Olivier }",

booktitle = "CPEM 2018 - Conference on Precision Electromagnetic Measurements",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

note = "2018 Conference on Precision Electromagnetic Measurements, CPEM 2018 ; Conference date: 08-07-2018 Through 13-07-2018",

}

Mubarak, F, Mascolo, V, Rietveld, G, Spirito, M, Daffe, K & Haddadi, K 2018, Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards. in P Tuckey, F Piquemal & O Thévenot (eds), CPEM 2018 - Conference on Precision Electromagnetic Measurements., 8500810, Institute of Electrical and Electronics Engineers (IEEE), 2018 Conference on Precision Electromagnetic Measurements, CPEM 2018, Paris, France, 8/07/18. https://doi.org/10.1109/CPEM.2018.8500810

Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards. / Mubarak, F.; Mascolo, V.; Rietveld, G. et al.
CPEM 2018 - Conference on Precision Electromagnetic Measurements. ed. / Philip Tuckey; François Piquemal; Olivier Thévenot . Institute of Electrical and Electronics Engineers (IEEE), 2018. 8500810.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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T1 - Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards

AU - Mubarak, F.

AU - Mascolo, V.

AU - Rietveld, G.

AU - Spirito, M.

AU - Daffe, K.

AU - Haddadi, K.

PY - 2018

Y1 - 2018

N2 - Methods for traceable characterization and uncertainty evaluation of planar I-port CPW short-open-Ioad (SOL) devices are developed. The agreement of modelling and verification measurement results greatly supports the application of the proposed parameterization models and used FEM-based EM modelling of CPW structures for traceable characterization of planar CPW-based SOL devices in the frequency range between a few kHz up to 50 GHz.

AB - Methods for traceable characterization and uncertainty evaluation of planar I-port CPW short-open-Ioad (SOL) devices are developed. The agreement of modelling and verification measurement results greatly supports the application of the proposed parameterization models and used FEM-based EM modelling of CPW structures for traceable characterization of planar CPW-based SOL devices in the frequency range between a few kHz up to 50 GHz.

KW - co-planar waveguide

KW - EM simulation

KW - measurement uncertainty

KW - nanostructures

KW - on-wafer calibration

KW - precision measurements

KW - traceability

KW - VNA

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U2 - 10.1109/CPEM.2018.8500810

DO - 10.1109/CPEM.2018.8500810

M3 - Conference contribution

AN - SCOPUS:85057061313

BT - CPEM 2018 - Conference on Precision Electromagnetic Measurements

A2 - Tuckey, Philip

A2 - Piquemal, François

A2 - Thévenot , Olivier

PB - Institute of Electrical and Electronics Engineers (IEEE)

T2 - 2018 Conference on Precision Electromagnetic Measurements, CPEM 2018

Y2 - 8 July 2018 through 13 July 2018

ER -

Mubarak F, Mascolo V, Rietveld G, Spirito M, Daffe K, Haddadi K. Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards. In Tuckey P, Piquemal F, Thévenot O, editors, CPEM 2018 - Conference on Precision Electromagnetic Measurements. Institute of Electrical and Electronics Engineers (IEEE). 2018. 8500810 doi: 10.1109/CPEM.2018.8500810

Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards

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