Standard

Predicting class testability using object-oriented metrics. / Bruntink, M; van Deursen, A.

SCAM 2004; Proceedings of the Fourth IEEE international worksho on source code analysis an manipulation. Los Alamitos, CA. USA : IEEE Computer Society, 2004. p. 136-145.

Research output: Scientific - peer-reviewConference contribution

Harvard

Bruntink, M & van Deursen, A 2004, Predicting class testability using object-oriented metrics. in SCAM 2004; Proceedings of the Fourth IEEE international worksho on source code analysis an manipulation. IEEE Computer Society, Los Alamitos, CA. USA, pp. 136-145, Forth IEEE international workshop on source code analysis and manipulation, Chicago, Ill. USA, 15-16 September.

APA

Bruntink, M., & van Deursen, A. (2004). Predicting class testability using object-oriented metrics. In SCAM 2004; Proceedings of the Fourth IEEE international worksho on source code analysis an manipulation. (pp. 136-145). Los Alamitos, CA. USA: IEEE Computer Society.

Vancouver

Bruntink M, van Deursen A. Predicting class testability using object-oriented metrics. In SCAM 2004; Proceedings of the Fourth IEEE international worksho on source code analysis an manipulation. Los Alamitos, CA. USA: IEEE Computer Society. 2004. p. 136-145.

Author

Bruntink, M; van Deursen, A / Predicting class testability using object-oriented metrics.

SCAM 2004; Proceedings of the Fourth IEEE international worksho on source code analysis an manipulation. Los Alamitos, CA. USA : IEEE Computer Society, 2004. p. 136-145.

Research output: Scientific - peer-reviewConference contribution

BibTeX

@inbook{f67625beddfc47bcbef82156e23d1ac1,
title = "Predicting class testability using object-oriented metrics",
keywords = "Conf.proc. > 3 pag",
author = "M Bruntink and {van Deursen}, A",
note = "ed. is niet bekend",
year = "2004",
isbn = "0-7695-2144-4",
publisher = "IEEE Computer Society",
pages = "136--145",
booktitle = "SCAM 2004; Proceedings of the Fourth IEEE international worksho on source code analysis an manipulation",
address = "United States",

}

RIS

TY - CHAP

T1 - Predicting class testability using object-oriented metrics

AU - Bruntink,M

AU - van Deursen,A

N1 - ed. is niet bekend

PY - 2004

Y1 - 2004

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7695-2144-4

SP - 136

EP - 145

BT - SCAM 2004; Proceedings of the Fourth IEEE international worksho on source code analysis an manipulation

PB - IEEE Computer Society

ER -

ID: 1289204